International Journal of Nano Dimension (Int. J. Nano Dimens.) Determination of porous Silicon thermal conductivity using the “Mirage effect” method Volume 5 (2014) Issue 3, July 2014 2024 02 29 Determination of porous Silicon thermal conductivity using the “Mirage effect” method 10.7508/ijnd.2014.03.008 EN F. Alfeel Department of Physics, Science Faculty, Damascus University, Syria. F. Awad Department of Physics, Science Faculty, Damascus University, Syria. F. Qamar Department of Physics, Science Faculty, Damascus University, Syria. Journal Article 2024 02 29 Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity with porosity changing was measured and the experiments result compared with theoretical results, and they were almost the same.