TY - EJOUR
AU - Ansari, Mohammad Amir
AU - Saeed, Syed Hasan
AU - Balodi, Deepak
AU - Khan, Mohd. Nauman
PY - 2024
DA - August
TI - A low leakage and high-speed phase frequency detector-charge pump designed in nano dimension based CMOS technology
T2 - International Journal of Nano Dimension (Int. J. Nano Dimens.)
VL - 15
L1 - https://old.oiccpress.com/international-journal-of-nano-dimension/article/a-low-leakage-and-high-speed-phase-frequency-detector-charge-pump-designed-in-nano-dimension-based-cmos-technology/
DO - 10.57647/j.ijnd.2024.1504.29
N2 - This research paper undertakes an innovative investigation into the conceptualization and execution of charge pump circuits that are specifically engineered in nano-dimension MOS transistor. In contrast to traditional Dickson-charge-pump models, the suggested configuration incorporates MOS transistors and anti-phase pumping clocks, which substantially increase output voltages and voltage pumping advantages. The PLL system’s PFD, Charge Pump circuit, and PFD are dynamic components, as demonstrated by a thorough analysis of these elements on RF-simulation tool. The accuracy of the proposed methodologies through rigorous simulations, establishing them as innovative approaches for low-voltage circuitry. In addition to contributing to the advancement of knowledge regarding charge pump designs, the research offers significant insights into the synergistic functioning of these circuits within a PLL system. The simulation outcomes validate the efficacy of the novel charge pump configuration, presenting low spur attenuation, high phase margin and high loop gain for implementation in low-power electronic systems. With a particular focus on optimizing design parameters, investigating sophisticated materials and fabrication technologies, and striving for innovative applications in domains like communication devices. This study establishes a foundation for revolutionary advancements in the design of low-leakage circuits and provides opportunities for novel approaches to the evolving field of electronic technologies.
IS - 4
PB - OICC Press
KW - Nano-Dimension, Charge Pump, Complementary Metal Oxide Semiconductor, Current Mismatch, Phase Frequency Detector, Phase Lock Loop 
EN -